ALLE KATEGORIENA new Atomic Force Microscope near electron counting
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Veröffentlichungszeit: 2018-12-14 Größe: 557 Kb Format: PDF Heruntergeladen: 43
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Einführung
A team of researchers have created a new Atomic Force Microscope with the help of Analog Devices electronics.
In particular, they measure the tiny currents produced by the piezoelectric effect with a transimpedance amplifier, which consists into a current-to-voltage converter. The work entitles “Piezo-generated charge mapping revealed through direct
piezoelectric force microscopy” published in the prestigious scientific journal Nature Communications.